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Conferences > OFC > 2015 > M3B > M3B.3

Reliability and Non-Hermetic Properties of Ge/Si Optoelectronic Devices

Su Li, Liangbo Wang, Tuo Shi, Pengfei Cai, Mengyuan Huang, Wang Chen, Ching-yin Hong, and Dong Pan

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Abstract

Our CMOS-foundry mass-produced Ge/Si optoelectronic devices have passed the high temperature accelerated aging test, THB test and HAST test, which demonstrate satisfactory reliability and promising potential for non-hermetic applications.

© 2015 Optical Society of America

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