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Optimal design of Ge-dot photoMOSFETs for highly-integrated monolithic Si Photonics

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Abstract

Ge-dot/SiO2/SiGe-channel photoMOSFETs are demonstrated on Si substrate. A decrease in the dot size and gate oxide thickness significantly enhances the photoresponsivity (9000A/W) with 6nW under 850nm illumination, and improves response time (0.48ns) and power consumption.

© 2017 Optical Society of America

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