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High Throughput Bandwidth Characterization of Silicon Photonic Modulators using Offset Frequency Combs

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Abstract

We develop a low complexity, high-throughput testing technique for concurrently characterizing the bandwidths of multiple in-series modulators with independent frequency combs. The approach is demonstrated on two serial modulators at 9.2 GHz and 15.5 GHz.

© 2018 The Author(s)

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