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Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

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Abstract

We demonstrate optical arbitrary waveform measurement (OAWM) using a silicon pho-tonic spectral slicer. Exploiting maximal-ratio combining (MRC), we demonstrate the viability of the scheme by reconstructing 100-GBd 64QAM signals with high quality.

© 2021 The Author(s)

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