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Simple and ultrafast automatic bias control for optical IQ modulators enabled by dither vector mapping monitoring

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Abstract

A simple and ultrafast automatic bias control for optical IQ modulators is proposed using dither-vector-mapping monitoring. It is verified in 40/20Gbaud 16/64QAM signal transmissions, and the tracking time (0.3~0.5s) is 30-times faster than commercial products.

© 2022 The Author(s)

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