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Conferences > OFC > 2022 > Th2A > Th2A.39

Optical Damage Threshold Screening Methodology for 28 GBd, Long Wavelength Avalanche Photodiodes

Alberto Ciarrocchi, Wei Quan, Markus Blaser, Maria Hämmerli, and Hektor Meier

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Abstract

We present a novel scalable wafer screening method that guarantees an optical damage threshold larger than +5 dBm for 28 GBd long wavelength avalanche photodiodes over large-scale production volumes.

© 2022 The Author(s)

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