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Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, and Philippe Absil

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Abstract

Dark current degradation mechanisms in Ge VPIN photodetectors were studied. A methodology to estimate the failure percentages has been developed and applied. Degradation/recovery processes and Ea-decrease of Idark after stress suggest increased TAT during degradation.

© 2022 The Author(s)

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