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Simultaneous Measurements of Angle of Arrival and Doppler Frequency Shift Based on Silicon Modulators

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Abstract

We experimentally demonstrate the simultaneous measurements of the microwave angle of arrival and Doppler frequency shift by silicon modulators. The measurement errors of AOA and DFS are less than 3° and 7.2×10-10 Hz at 30 GHz, respectively.

© 2023 The Author(s)

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