Abstract

Electronic speckle pattern interferometry (ESPI) has been used for a number of years for engineering applications, with conventional bulk optic technology, because of its advantages of pseudo-real time display of static and dynamic deformations of objects over an extended viewing area [1,2]. Recently, the incorporation of monomode optical fibre has considerably simplified the optical arrangement and combined with recent advances in image processing technology has led to powerful instruments that are readily employed in real engineering environments away from optical vibration isolation tables [3].

© 1992 Optical Society of America