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Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry — Proposal and Demonstration —

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Abstract

We propose a novel low coherence interferometry, in which both a mirror of the reference arm and a measured object (or a focusing lens) are placed on precise translation stages in order to perform simultaneous measurement of the refractive index n and thickness t of transparent plates used as the object. A 0.1-% measurement accuracy should be retained, under the condition that the object thickness t è ΙΟΟμτη, by the use of commercially available stages. In our present experiment, the accuracy of 0.3% was obtained for nearly 1-mm thick objects.

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