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Source Modulation Techniques for Static Deformation and Vibration Measurement in Optoelectronic Shearography

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Abstract

Source wavelength modulation in an unbalanced Michelson shearing interferometer is demonstrated as a means of phase modulation for optoelectronic shearography. This eliminates the requirement for an active phase-shifting component in the detection head. The technique is demonstrated for both static deformation and vibration measurements.

© 1996 IEICE

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