Application of Zernike Polynomials to Reduction of Wavefront-Slope Data

Nancy H. Davis; Teresa A. Fritz

doi:10.1364/OFT.1979.ST39

Workshop on Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1979),
paper ST39
•https://doi.org/10.1364/OFT.1979.ST39

Application of Zernike Polynomials to Reduction of Wavefront-Slope Data

Nancy H. Davis and Teresa A. Fritz

Optical Fabrication and Testing 1979

Tucson, Arizona United States
5–7 November 1979
ISBN:

From the session
Special Techniques (ST)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
N. H. Davis and T. A. Fritz, "Application of Zernike Polynomials to Reduction of Wavefront-Slope Data," in Workshop on Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1979), paper ST39.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

In testing optical surfaces, several very useful tests are those which depend on the slope of the surface These include the Hartmann test, Ronchi test, Foucault knife-edge test, and others.¹

PDF Article

More Like This

Phase Reconstruction using Zernike Orthogonal Slope Polynomials

Jayoung Nam, Larry N. Thibos, and D. Robert Iskander
FThM2 Frontiers in Optics (FiO) 2008

Zernike Polynomial Representations of Videokeratoscope Height Data

Jim Schwiegerling, John E. Greivenkamp, and Joseph M. Miller
FC3 Vision Science and its Applications (VSIA) 1995

Wavefront measurement using radial shear interferometry and Zernike polynomials

Gary E. Sommargren
MW5 OSA Annual Meeting (FIO) 1986

Previous Article Next Article