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Interferometric Surface Metrology of Magnetic Recording Materials

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Abstract

Surface roughness of magnetic recording media has been experimentally and theroetically related to the performance of the media (ref. 1). A computerized three-dimensional interferometer (ref. 2) has become an invaluable aid in the development of current and next generation recording products. Correlations of −0.95 and better are routinely achieved between the measured RMS roughness and magnetic performance measures such as rf output in dB.

© 1985 Optical Society of America

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