Abstract

Most traditional methods of measuring specular reflectance rely on high mechanical precision of the measuring fixture and/or on the use of a calibrated reflectance standard. In addition, many of these methods measure reflectance at only one angle of incidence, usually near normal incidence. This presentation will describe simple fixtures and calibration methods for performing spectral measurements of specular reflectivity over a broad range of incidence angles, Computerized data acquisition and manipulation are an essential aspect of this approach.

© 1990 Optical Society of America