Optical systems of imaging interferometers

Xue Mingqiu; Xiangli Bin; An Baoqing

doi:10.1364/IODC.1998.JWD.1

Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1998),
paper JWD.1
•https://doi.org/10.1364/IODC.1998.JWD.1

Optical systems of imaging interferometers

Xue Mingqiu, Xiangli Bin, and An Baoqing

Optical Fabrication and Testing 1998

Kailua-Kona, Hawaii United States
8–10 June 1998
ISBN:

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Joint Session with International Optical Design Conference: Interferometer Design and Testing (JWD)

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X. Mingqiu, X. Bin, and A. Baoqing, "Optical systems of imaging interferometers," in Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1998), paper JWD.1.

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Abstract

The throughput and multiplex advantages of FTSs are well known. But the drawbacks of the traditional temporally modulated instruments with mechanical scanning parts have encouraged the development of spatially modulated FTSs or IFTSs^[1-4]. Figure 1 is one of such instruments.

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