Abstract

A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation films. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution at the line type of imaging spectrometer changes the sinusoidal wave along wave number. A Fourier transform method is employed to analyze the retardation of the sample. In the results, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.

© 2006 Optical Society of America