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Conferences > OFT > 2010 > OMB > OMB2
  • International Optical Design Conference and Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2010),
  • paper OMB2
  • •https://doi.org/10.1364/OFT.2010.OMB2

Predicting Image Degradation from Optical Surface Metrology Data

James E. Harvey, Narak Choi, Andrey Krywonos, and Gary Peterson

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Abstract

A generalization of Peterson’s elegant surface scatter model results in an improved capability to predict image degradation from optical surface metrology data. A new unified surface scatter theory for moderately rough surfaces provides the necessary BSDF data.

© 2010 OSA, SPIE

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