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Conferences > OFT > 2014 > OW3B > OW3B.4

Freeform Optics Metrology Using Optical Coherence Tomography

Jianing Yao and Jannick P. Rolland

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Abstract

We investigate the capability of a custom Fourier-domain swept-source optical coherence tomography method for non-contact freeform optics metrology. First results demonstrate the feasibility of measurement of an Alvarez surface with 400 µm sag.

© 2014 Optical Society of America

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