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Conferences > OFT > 2019 > JT5A > JT5A.12

Detection and Quantification of Surface Defects in Silicon during Diamond Turning

Neha Khatri, Suman Tewary, Harry Garg, Vinod Karar, and R.K. Sinha

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Abstract

In present research, the optimum machining conditions during diamond turning of silicon to achieve defect free surface are identified and depth of defect encountered during various machining combinations using image processing technique is evaluated.

© 2019 The Author(s)

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