Flat Optics Optical Function and Fabrication Process Characterization using Quadri-Wave Lateral Shearing Interferometry based Wavefront Sensor

Valentin Genuer; Romain Laberdesque; Benoit Wattellier

doi:10.1364/FLATOPTICS.2021.JTu1A.15

OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT)
OSA Technical Digest (Optica Publishing Group, 2021),
paper JTu1A.15
•https://doi.org/10.1364/FLATOPTICS.2021.JTu1A.15

Flat Optics Optical Function and Fabrication Process Characterization using Quadri-Wave Lateral Shearing Interferometry based Wavefront Sensor

Valentin Genuer, Romain Laberdesque, and Benoit Wattellier

Optical Fabrication and Testing 2021

Washington, DC United States
27 June–1 July 2021
ISBN: 978-1-943580-88-0

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V. Genuer, R. Laberdesque, and B. Wattellier, "Flat Optics Optical Function and Fabrication Process Characterization using Quadri-Wave Lateral Shearing Interferometry based Wavefront Sensor," in OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT), F. Capasso, W. Chen, P. Dainese, J. Fan, J. DeGroote Nelson, F. Duerr, J. Rogers, J. Rolland, P. Clark, R. Pfisterer, H. Rehn, S. Thibault, M. Jenkins, D. Wook Kim, and N. Trela-McDonald, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper JTu1A.15.

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Abstract

Wavefront sensor based on Quadriwave Lateral Shearing Interferometry is used to fully characterize flat optics and metasurfaces. It measures both the global optical function (phase shaping, MTF, PSF, …) but also the metastructure arrangement. © 2021 Valentin Genuer, Romain Laberdesque, Benoit Wattellier

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