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Telephoto-Based Optical Differentiation Wavefront Sensor and Alignment Tolerance for Freeform Metrology

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Abstract

An Optical Differentiation Wavefront Sensor using telephoto design that reduces the system length is presented. Measurement of freeform wavefront showed RMS accuracy < λ/10(λ=633 nm) and robustness to alignment uncertainty as accuracy change of λ/50.

© 2021 The Author(s)

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More Like This
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