Faster &amp; More Accurate Measurement of Surface Radius

Robert Smythe

doi:10.1364/OFT.2021.OW3B.4

OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT)
OSA Technical Digest (Optica Publishing Group, 2021),
paper OW3B.4
•https://doi.org/10.1364/OFT.2021.OW3B.4

Faster & More Accurate Measurement of Surface Radius

Robert Smythe

Optical Fabrication and Testing 2021

Washington, DC United States
27 June–1 July 2021
ISBN: 978-1-943580-88-0

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Testing: Mid-spatial Frequency (MSF) and Radius (OW3B)

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R. Smythe, "Faster & More Accurate Measurement of Surface Radius," in OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT), F. Capasso, W. Chen, P. Dainese, J. Fan, J. DeGroote Nelson, F. Duerr, J. Rogers, J. Rolland, P. Clark, R. Pfisterer, H. Rehn, S. Thibault, M. Jenkins, D. Wook Kim, and N. Trela-McDonald, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper OW3B.4.

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Abstract

Spectrally Controlled Interferometry measures surface form and radius in one measurement, with 2X improved accuracy, 4X faster measurements, without the need for precision mechanics. Industry survey data is presented regarding desired accuracy

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