Determination of The Optical Constants and Thickness of Thin Films by Measurement of Surface Plasmon Resonances

F. S. Zhang; H. A. Macleod; M. R. Jacobson

doi:10.1364/OIC.1988.WC20

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper WC20
•https://doi.org/10.1364/OIC.1988.WC20

Determination of The Optical Constants and Thickness of Thin Films by Measurement of Surface Plasmon Resonances

F. S. Zhang, H. A. Macleod, and M. R. Jacobson

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

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Optical Properties of Thin Films: 2 (WC)

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F. S. Zhang, H. A. Macleod, and M. R. Jacobson, "Determination of The Optical Constants and Thickness of Thin Films by Measurement of Surface Plasmon Resonances," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper WC20.

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Abstract

Surface plasmon resonances in metallic and dielectric thin films can be measured to determine their optical constants and thicknesses. Some optical constants and thicknesses for Ag, Al, Cu, Ta₂O₅, ZrO₂, and SiO₂ films are presented.

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