Measurement of Ultralow Losses in Dielectric Mirrors

R. Lalezari; G. Rempe; R.J. Thompson; H.J. Kimble

doi:10.1364/OIC.1992.OThD8

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1992),
paper OThD8
•https://doi.org/10.1364/OIC.1992.OThD8

Measurement of Ultralow Losses in Dielectric Mirrors

R. Lalezari, G. Rempe, R.J. Thompson, and H.J. Kimble

Optical Interference Coatings 1992

Tucson, Arizona United States
1–5 June 1992
ISBN:

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Optical Characterization (OThD)

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R. Lalezari, G. Rempe, R. J. Thompson, and H. J. Kimble, "Measurement of Ultralow Losses in Dielectric Mirrors," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1992), paper OThD8.

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Abstract

Characterization of low loss mirrors by measurements of cavity decay time and of cavity finesse are reported around 850 nm. The lowest observed loss is 1.6 ppm (transmission and absorption and scatter), corresponding to a reflectivity of 0.9999984.

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