Abstract
Dobrowolski, et al.(1) and Bovard (2) have reported extensively on the use of Fourier transform techniques to systhesize thin film designs. Both authors mention the approximations of the Q-functions which have been used to date and the limitations imposed by those approximations. Q-functions are the relationship of the amplitude in index of refraction versus optical thickness domain to the reflectance versus frequency domain. Bovard also discusses the frequency scale distortions around high reflection bands and how this might be approximately corrected. The Fourier technique shows great promise to provide a guide to the solutions for challenging thin film designs, and the referenced authors show how to obtain useful results in spite of the limitations and approximations. However, the two problems of the Q-function and the apparent frequency scale distortions have interested this author for some time as a result of an earlier collaboration with Verly and Dobrowolski (3) and our own subsequent investigations.
© 1992 Optical Society of America
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