Abstract

Thin film electroluminescent devices are now attracting much attention since they have open up a way to the application to the flat panel display. However, the bases of the physical phenomena governing the electroluminescence have been reported comparatively little. This is due to the difficulties to treat in detail the carrier dynamics of the interface and the bulk in the high electric field (1). In this paper, we study experimentally the field distribution in phosphor layer and the properties of insulator/phosphor interface.

© 1995 Optical Society of America