Abstract

Photothermal deflection techniques (PD) have been developed at the beginning of the eighties¹-² and widely employed over the last few years to characterize optical coatings³-¹⁴. Their success originates from various advantages: the absence of any mechanical contact with the sample, the ease of implementing ( no sample preparation for example ), high sensitivity and the possibility of application to microscopy and imaging.

© 1995 Optical Society of America