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Performance of Thin-Film Structures in the Presence of Random Interlayer Roughness

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Abstract

Methods are available to design highly specialized waveguide structures and multilayer-coated optical components that may be a critical element in the performance of optical systems. Since the performance of all optical systems is jeopardized by interface roughness, differences between ideal and actual performance could be severe. Even though a component may perform within system requirements, scattering and absorption may contribute to less than fully capable operation.

© 1998 Optical Society of America

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