Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Scattering Measurements From A Thin Metallic Film in the Attenuated Total Reflection

Not Accessible

Your library or personal account may give you access

Abstract

The reflected and transmitted fields scattered from a thin film with a shallow random rough surface between dissimilar media is typically neglected. In an early paper ref. [1], scattering is calculated considering surface plasma waves as a probe, excited in an experimental arrangement known as the Attenuated Total Reflection technique (ATR). In resonant condition forward and backscattering peaks were predicted. In this work, experimental measurement of scattering from this system is reported.

© 1998 Optical Society of America

PDF Article
More Like This
Modified attenuated total reflection for the fast and routine electrooptic measurements of nonlinear optical polymer thin films

Antao Chen, Vadim Chuyanov, Sean Garner, William H. Steier, and Larry R. Dalton
ThE.18 Organic Thin Films for Photonic Applications (OTF) 1997

Scattering of light from a film with a random rough surface on a metallic substrate

Raúl García-Llamas, Cesar Márquez-Beltran, and Kevin O’Donnell
ThA.2 Optical Interference Coatings (OIC) 1998

The Influence of Surface Roughness on The Surface Plasma Wave

Cheng-Chung Lee and Yi-Jun Jen
ThA.3 Optical Interference Coatings (OIC) 1998

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved