Abstract
The reflected and transmitted fields scattered from a thin film with a shallow random rough surface between dissimilar media is typically neglected. In an early paper ref. [1], scattering is calculated considering surface plasma waves as a probe, excited in an experimental arrangement known as the Attenuated Total Reflection technique (ATR). In resonant condition forward and backscattering peaks were predicted. In this work, experimental measurement of scattering from this system is reported.
© 1998 Optical Society of America
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