Abstract
While most scattering studies are currently based on the intensity of the scattered waves, relevant additional information can be found in the complex amplitude of these waves, characterized by a phase term. In this context first results were presented at the previous Tucson Meeting that concerned a technique based on the angle-resolved ellipsometry of light scattering [1].
© 1998 Optical Society of America
PDF ArticleMore Like This
G. Georges, L. Arnaud, C. Deumié, and C. Amra
ThA3 Optical Interference Coatings (OIC) 2007
Raúl García-Llamas, Cesar Márquez-Beltran, and Kevin O’Donnell
ThA.2 Optical Interference Coatings (OIC) 1998
C. Deumié, H. Giovannini, G. Albrand, H. Akhouayri, and Claude Amra
WB15 Optical Interference Coatings (OIC) 1995