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Conferences > OIC > 1998 > TuA > TuA.2

Optical and microstructural properties of silver-based films

H. Rafla-Yuan and B. P. Hichwa

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Abstract

Characterization of the optical and microstructural properties of durable Ag films with Variable Angle Spectroscopic Ellipsometer (VASE) and X-ray Photoelectron Spectroscopy (XPS).

© 1998 Optical Society of America

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