Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > OIC > 1998 > TuB > TuB.2

Estimation of the optical constants and thickness of thin films using unconstrained optimization

E. G. Birgin, J. M. Martínez, and I. Chambouleyron

Not Accessible

Your library or personal account may give you access

Abstract

The transmission of a thin film on a transparent substrate is a function of the wavelength (λ) and given by:1 where A, B, C, and D are functions of n(λ), k(λ), and d — the refractive index, the extinction coefficient, and the thickness of the film, respectively— and the refractive index of the substrate, assumed to be known.

© 1998 Optical Society of America

PDF Article
More Like This
Method of Determining Optical Constants of Thin Films Using an Infrared Ellipsometer

Y. Yen and K. Q. Zhang
WC12 Optical Interference Coatings (OIC) 1988

Determination of optical constants and thickness of crystalline SrxBa1–xNb2O6 thin films by single transmission measurement

Weidong Shen, Xu Liu, Zhiru Shen, Hui Ye, Peifu Gu, and Jinfa Tang
WB3 Optical Interference Coatings (OIC) 2004

Determination of The Optical Constants and Thickness of Thin Films by Measurement of Surface Plasmon Resonances

F. S. Zhang, H. A. Macleod, and M. R. Jacobson
WC20 Optical Interference Coatings (OIC) 1988

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use