Absorptivity measurement for thin films based on surface thermal lensing

Shuhai Fan; Hongbo He; Jianda Shao; Zhengxiu Fan; Dongqing Zhang

doi:10.1364/OIC.2004.WB4

Optical Interference Coatings
OSA Technical Digest Series (Optica Publishing Group, 2004),
paper WB4
•https://doi.org/10.1364/OIC.2004.WB4

Absorptivity measurement for thin films based on surface thermal lensing

Shuhai Fan, Hongbo He, Jianda Shao, Zhengxiu Fan, and Dongqing Zhang

Optical Interference Coatings 2004

Tucson, Arizona United States
27 June–2 July 2004
ISBN: 3-5400-0364-9

From the session
Characterization of Optical Coatings I (WB)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
S. Fan, H. He, J. Shao, Z. Fan, and D. Zhang, "Absorptivity measurement for thin films based on surface thermal lensing," in Optical Interference Coatings, OSA Technical Digest Series (Optica Publishing Group, 2004), paper WB4.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Two absorptivity measuring methods by a measurement system based on Surface Thermal Lensing theory are given. The measuring results indicate a deviation of 5ppm and the sensitivity is better than 10ppm.

PDF Article

More Like This

Photothermal measurements of absorption and thermal conductivity of thin films

Z. L. Wu, M. Reichling, X.-Q. Hu, K. Balasubramanian, and K. H. Guenther
OThD17 Optical Interference Coatings (OIC) 1992

Micro-structured thin-film based photonic crystal for directive thermal sources

Z. Elalamy, J. Fiere, S. Enoch, L. Escoubas, J. J. Simon, F. Flory, and F. Lemarquis
MF8 Optical Interference Coatings (OIC) 2004

Stress, microstructure and thermal-elastic properties of evaporated thin MgF2 – films

R. Thielsch, J. Heber, T. Feigl, and N. Kaiser
ThE6 Optical Interference Coatings (OIC) 2004

Previous Article Next Article