Abstract
Photothermal deflection technique permits to highlight the presence of absorbing defects in optical components. This non-destructive tool is of a great interest to understand the role of impurities in laser-induced damage process. The detection of nano-sized isolated inclusions requieres to develop a very sensitive photothermal setup. Thus, it is essential to improve the detection up to its theoretical limit.
© 2004 Optical Society of America
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