High-precision measurements of the specular reflectivity

Hervé Piombini; Philippe Voarino; Frédéric Sabary; Daniel Marteau; Jimmy Dubard; Jacques Hameury; Jean Remy Filtz

doi:10.1364/OIC.2007.ThA6

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper ThA6
•https://doi.org/10.1364/OIC.2007.ThA6

High-precision measurements of the specular reflectivity

Hervé Piombini, Philippe Voarino, Frédéric Sabary, Daniel Marteau, Jimmy Dubard, Jacques Hameury, and Jean Remy Filtz

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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Measurements I (ThA)

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H. Piombini, P. Voarino, F. Sabary, D. Marteau, J. Dubard, J. Hameury, and J. R. Filtz, "High-precision measurements of the specular reflectivity," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper ThA6.

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Abstract

The spectrophotometer described is designed to measure specular reflectance with a high degree of accuracy. It can measure shape piece, antireflective or reflective coating and make cartographies in order to detect heterogeneities of coating.

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