Characterizing Multilayer, Low Diattenuation Mirrors With a Mueller Matrix Imaging Polarimeter

Paula K. Smith; Russell A. Chipman

doi:10.1364/OIC.2007.ThB4

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper ThB4
•https://doi.org/10.1364/OIC.2007.ThB4

Characterizing Multilayer, Low Diattenuation Mirrors With a Mueller Matrix Imaging Polarimeter

Paula K. Smith and Russell A. Chipman

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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Measurement Problem / Measurements II (ThB)

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P. K. Smith and R. A. Chipman, "Characterizing Multilayer, Low Diattenuation Mirrors With a Mueller Matrix Imaging Polarimeter," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper ThB4.

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Abstract

A multilayer, low diattenuation mirror was measured with a Muller matrix imaging polarimeter. The measured diattenuation and absolute reflectance were used to characterize the optical constants of each layer in-situ using a Levenberg-Marguardt optimization.

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