Abstract
A procedure for selective extinction of light scattering is described in some recent papers [1, 2]. It is based on null ellipsometry principles applied on scattered fields. In this paper, this technique is used for isolate each interface of a multilayer component. The light scattered by all interface except one is cancelled to observe only one. The aim of this work is the non destructive characterization of each optical component interface.
© 2010 Optical Society of America
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