Abstract
A precise identification of the dielectric materials dispersion data, involved forming the layer stack, is crucial for obtaining satisfactory results utilizing optical broadband monitoring for high precision control of thin-film optical filters.
© 2010 Optical Society of America
PDF ArticleMore Like This
S. Atarah, A. Voronov, S. Song, and F. Placido
TuC9 Optical Interference Coatings (OIC) 2010
Alexander V. Tikhonravov, Michael K. Trubetskov, Tatiana V. Amotchkina, Gary DeBell, Vladimir Pervak, and Anna Krasilnikova Sytchkova
ThA6 Optical Interference Coatings (OIC) 2010
Brian T. Sullivan and Graham Carlow
TuC1 Optical Interference Coatings (OIC) 2010