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Conferences > OIC > 2013 > WA > WA.6

The mechanical properties of the SiO2 optical thin film produced by compound film formation of sputtering and vacuum deposition

Takashi Kaite, Tomoaki Takahashi, Shigeharu Matsumoto, Hiroshi murotani, Yoshinori Seino, and Toshihiro Abe

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Abstract

In order to deposit films directly on an acrylic resin, we used the compound film formation system. In appearance yellowing or deformation was not observed. Adhesive properties were evaluated using a pencil hardness test.

© 2013 Optical Society of America

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