Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Organic Thin Film Thickness Profile and Refractive Index Measurements by White-Light Scanning Interferometer

Not Accessible

Your library or personal account may give you access

Abstract

The article investigated the dependence of the sensitivities of the Fourier amplitude and nonlinear phase spectra on the thin-film properties. A method has been applied to measure organic thin-film thickness profile and refractive index.

© 2016 Optical Society of America

PDF Article
More Like This
A Multiplexed Biosensor Based on White-light Scanning Interferometer

Huai-Yi Wang, Ying-Feng Chang, Li-Chen Su, Yu-Xen Lin, Cheng-Chung Lee, and Menh-Chi Li
TB.2 Optical Interference Coatings (OIC) 2016

Image-scanning ellipsometry for the measurement of thin-film thickness profiles

An-Hong Liu, Peter C. Wayner, and Joel L. Plawsky
WBB.4 OSA Annual Meeting (FIO) 1993

New technique for measurement of refractive index and thickness of polymer thin films

T. N. Ding and Elsa Garmire
TUM37 Conference on Lasers and Electro-Optics (CLEO:S&I) 1983

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved