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Non-Contact Technique to Measure Conductivity of Thin Films Using Terahertz Time-Domain Spectroscopy

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Abstract

Terahertz time-domain spectroscopy was used as a non-contact method to measure theconductivity of an ITO film and a photoexcited MEH-PPV film. The experimental data from ITO measurement were fit and agree with a Drude relationship. Article not available.

© 2006 Optical Society of America


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