Digital Approach for Pattern Scale Measurement

Joseph Rosen; Lior Dezialoshinski; Ehud Nahtomi; Joseph Shamir

doi:10.1364/OPTCOMP.1991.ME28

Optical Computing
Technical Digest Series (Optica Publishing Group, 1991),
paper ME28
•https://doi.org/10.1364/OPTCOMP.1991.ME28

Digital Approach for Pattern Scale Measurement

Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, and Joseph Shamir

Optical Computing 1991

Salt Lake City, Utah United States
4–6 March 1991
ISBN:

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J. Rosen, L. Dezialoshinski, E. Nahtomi, and J. Shamir, "Digital Approach for Pattern Scale Measurement," in Optical Computing, Technical Digest Series (Optica Publishing Group, 1991), paper ME28.

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Abstract

Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.

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