Nonlinear M-line technic for organic guiding layer characterization.

G. Vitrant; R. Reinisch; F. Kajzar

doi:10.1364/OTFA.1993.ThB.4

Organic Thin Films for Photonic Applications
Technical Digest Series (Optica Publishing Group, 1993),
paper ThB.4
•https://doi.org/10.1364/OTFA.1993.ThB.4

Nonlinear M-line technic for organic guiding layer characterization.

G. Vitrant, R. Reinisch, and F. Kajzar

Organic Thin Films for Photonic Applications 1993

Ontario Canada
5–7 October 1993
ISBN:

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Third-Order Measurements (ThB)

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G. Vitrant, R. Reinisch, and F. Kajzar, "Nonlinear M-line technic for organic guiding layer characterization.," in Organic Thin Films for Photonic Applications, Technical Digest Series (Optica Publishing Group, 1993), paper ThB.4.

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Abstract

The nonlinear M-line technic allows the easy determination of Kerr properties of organic thin films. Simple modelization tools are presented and experimental results are reported.

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