Terahertz near-field microscopy

P. C. M. Planken; C. W. E. M. van Rijmenam; N. C. J. van der Valk

doi:10.1364/OTST.2005.TuC1

Optical Terahertz Science and Technology
Technical Digest (CD) (Optica Publishing Group, 2005),
paper TuC1
•https://doi.org/10.1364/OTST.2005.TuC1

Terahertz near-field microscopy

P. C. M. Planken, C. W. E. M. van Rijmenam, and N. C. J. van der Valk

Optical Terahertz Science and Technology 2005

Orlando, Florida United States
14–16 March 2005
ISBN: 1-55752-786-5

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Imaging and Microscopy (TuC)

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P. C. M. Planken, C. W. E. M. van Rijmenam, and N. C. J. van der Valk, "Terahertz near-field microscopy," in Optical Terahertz Science and Technology, Technical Digest (CD) (Optica Publishing Group, 2005), paper TuC1.

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Abstract

We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement of a phonon resonance in THz apertureless scanning near-field optical microscopy.

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