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Conferences > PEMD > 2003 > MCI > 29

Investigation of Photorefractive Strontium-Barium-Niobate Crystals with Atomic Force Microscopy

Elisabeth Soergel, Ákos Hoffmann, Nils Benter, and Karsten Buse

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Abstract

Electrostatic force microscopy is a powerful technique to measure with high resolution charge distributions on photorefractive materials. Charge patterns on as-grown crystal surfaces of Sr0.61Ba0.39Nb2O6 (SBN) are presented. They show the influence of crystal steps and reveal the presence of small clusters of electron traps in the crystal. Their behavior after illumination as well as profiles of light-induced charge gratings on SBN are investigated.

© 2003 Optical Society of America

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