Abstract
Scanning Near-field Optical Microscopy (SNOM) technique has been used in collection mode to probe the evanescent field at the surface of ion-implanted SBN planar waveguides. A commercial SNOM system has been implemented with a specific sample holder. Our low scale in situ investigations allow to visualize the variation of the mode intensity distribution in photorefractive waveguides as a function of the externally applied electric field.
© 2003 Optical Society of America
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