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Conferences > PEMD > 2003 > MCI > 73

Electro-optical properties of photorefractive Sn2P2S6

D. Haertle, G. Caimi, A. Haldi, G. Montemezzani, P. Günter, A. A. Grabar, I. M. Stoika, and Yu. M. Vysochanskii

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Abstract

We measured the electro-optical properties of Sn2P2S6 single crystals for electric fields parallel to the crystallographic x-axis. A direct interferometric technique is used and unclamped as well as clamped values are determined. The measured coefficients are large, with a maximum of 174 ± 10 pm/V for the unclamped coefficient r111T at λ = 633 nm. The corresponding reduced half-wave voltage is Vπ = 124 V.

© 2003 Optical Society of America

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