Abstract

A scanning force microscope (SFM) is an ideal tool for non-destructive investigation of ferroelectric domains in photorefractive crystals. Since application of such domains for efficient optical frequency conversion (periodically-poled lithium niobate, PPLN) and for ultrahigh-density data storage require µm and nm-sized domain structures, the high lateral resolution offered by the SFM is highly desired. However, the mechanism causing the domain contrast observed in SFM measurements is not yet fully understood. Investigations of the x- and z-faces of PPLN samples demonstrated that instead of mechanical piezoresponse an electrostatic interaction is responsible for the observed domain contrast.

© 2005 Optical Society of America