Abstract

Timing jitter can limit the accuracy of data obtained by optical sampling using repetitively pulsed semiconductor lasers. When the optical sampling is used for real-time analog-to-digital conversion, for example, the maximum allowable jitter is typically 20-40 times less than the maximum permissible pulse width¹. Timing jitter in semiconductor lasers has been studied experimentally^2,3, but a predictive model has not heretofore been available.

© 1989 Optical Society of America