Amplitude and Phase Measurement in Photorefractive Time- Average Interferometry: A Comparison with Electronic Speckle Pattern Interferometry

H. Rohleder; P. M. Petersen; A. Marrakehi

doi:10.1364/PMED.1993.SaD.3

Photorefractive Materials, Effects And Devices Prm'93
Technical Digest Series (Optica Publishing Group, 1993),
paper SaD.3
•https://doi.org/10.1364/PMED.1993.SaD.3

Amplitude and Phase Measurement in Photorefractive Time- Average Interferometry: A Comparison with Electronic Speckle Pattern Interferometry

H. Rohleder, P. M. Petersen, and A. Marrakehi

Photorefractive Materials, Effects, and Devices II 1993

Kiev Ukraine
11–15 August 1993
ISBN:

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Interferometry & Sensors (SaD)

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H. Rohleder, P. M. Petersen, and A. Marrakehi, "Amplitude and Phase Measurement in Photorefractive Time- Average Interferometry: A Comparison with Electronic Speckle Pattern Interferometry," in Photorefractive Materials, Effects And Devices Prm'93, Technical Digest Series (Optica Publishing Group, 1993), paper SaD.3.

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Abstract

Time-average interferometry of vibrating diffusely scattering structures was introduced by Powell and Stetson in 1967.1

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